Design for testability (DFT)

Unlocking the full potential of your semiconductor tests from RTL-level quality checks to scan methodology

Redefining semiconductor testing

Mirafra specializes in Design for Testability (DFT) to boost IC test coverage, yields, and quality. With a strong ATE test team and infrastructure, we’re uniquely positioned to enhance IC testability for first-pass silicon. Our DFT services encompass RTL-level quality checks, architecture development, scan methodology, pattern generation, memory BIST, boundary scan, and more. We leverage state-of-the-art tools like Modus, Tessent, Spyglass, and VCS to ensure precision and quality in DFT implementation. Mirafra is your trusted partner for superior IC testability.

Pen testing

The industries that build the products for Healthcare, Government organizations, banking and finance, payment gateways (Credit/Debit card, Paytm, Gpay., etc), Educational, manufacturing, IOT based, cloud based have to double ensure the security of their user data by implementing and monitoring the firewalls, test their router configurations and the ports accessibility also needs to validate the logs these applications will generate, there may be need to perform proper code reviews through proper code scanners.

Nowadays the role of an ethical hacker is gaining more importance in the industry, any engineer who wants to become an ethical hacker should have a very good understanding of computer networking and should have attained certifications like CEH and OSCP.

Key features

Measuring our impact

Our DFT team with over 15 years of expertise, supporting more than 100 projects across various methodologies. We excel in a wide range of Design for Testability (DFT) techniques, including Scan Insertion, ATPG, GLS, MBIST, LBIST, JTAG, and Post-Silicon Debug, offering comprehensive support in this niche domain.

Supported 100+ projects in various methodologies
Excel in Scan Insertion, ATPG, GLS, MBIST, LBIST, JTAG, and Post-Silicon Debug

Inculcating trust and success, worldwide

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