Design for testability (DFT)
Unlocking the full potential of your semiconductor tests from RTL-level quality checks to scan methodology
Redefining semiconductor testing
Mirafra specializes in Design for Testability (DFT) to boost IC test coverage, yields, and quality. With a strong ATE test team and infrastructure, we’re uniquely positioned to enhance IC testability for first-pass silicon. Our DFT services encompass RTL-level quality checks, architecture development, scan methodology, pattern generation, memory BIST, boundary scan, and more. We leverage state-of-the-art tools like Modus, Tessent, Spyglass, and VCS to ensure precision and quality in DFT implementation. Mirafra is your trusted partner for superior IC testability.
Pen testing
The industries that build the products for Healthcare, Government organizations, banking and finance, payment gateways (Credit/Debit card, Paytm, Gpay., etc), Educational, manufacturing, IOT based, cloud based have to double ensure the security of their user data by implementing and monitoring the firewalls, test their router configurations and the ports accessibility also needs to validate the logs these applications will generate, there may be need to perform proper code reviews through proper code scanners.
Nowadays the role of an ethical hacker is gaining more importance in the industry, any engineer who wants to become an ethical hacker should have a very good understanding of computer networking and should have attained certifications like CEH and OSCP.
Key features
RTL-level quality checks
Mirafra performs checks at the Register-Transfer Level (RTL) to identify and address testability issues early in the IC design process
Architecture development
They work on optimizing the IC's architecture to enhance testability, making architectural choices that facilitate easier testing
Scan methodology
Expertise in creating effective scan chains and methodologies to enable comprehensive testing
Pattern generation
Creation of test patterns to ensure all aspects of the IC can be effectively tested
Memory BIST
Built-in self-test capabilities for memory testing, simplifying the testing process
Boundary scan
Implementing boundary scan techniques, often using standards like IEEE 1149.1 (JTAG), for testing I/O pins and board-level interconnections
Tool utilization
Use of state-of-the-art tools like Modus, Tessent, Spyglass, and VCS to ensure precision and quality in DFT implementation
ATE test team and infrastructure
A strong team and infrastructure for Automated Test Equipment (ATE) testing, ensuring efficient and accurate IC testing
First-pass silicon
The goal of enhancing IC testability is to achieve success on the first attempt, leading to cost and time savings
Comprehensive DFT services
Offering a full suite of DFT services, encompassing various aspects of DFT to address the unique needs of each IC design
Measuring our impact
Our DFT team with over 15 years of expertise, supporting more than 100 projects across various methodologies. We excel in a wide range of Design for Testability (DFT) techniques, including Scan Insertion, ATPG, GLS, MBIST, LBIST, JTAG, and Post-Silicon Debug, offering comprehensive support in this niche domain.
Inculcating trust and success, worldwide
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Inculcating trust and success, worldwide
What our clients say about us
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Anandita CEO of
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Anandita CEO of
